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Instrument Name | Optical Microscope |
Manufacturer | NIKON |
Model/Serial No. | MA100N |
Detail | Microstructure analysis at magnification X50, X100, X500 and X1000. Which can analyze microstructure, defect check such as porosity or shrinkage, measure the grain size of primary silicon. Including finding the percentage of porosity or cavity shrinkage per area. |
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Instrument Name | Digital Microscope |
Manufacturer | KEYENCE |
Model/Serial No. | VHX-950F |
Detail | Microstructure analysis at magnification X50, X100, X250, X300, X500, X1000, X1500 and X2000. Which can analyze microstructure, defect check defect such as porosity or shrinkage. |